GATE XE · 2025 · XE-C
Question 54: Characterization and Measurements of Properties
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Question 54
XE-CMCQ2 marksNeeds review
Match the detector for a scanning electron microscope (SEM) in Column I with the resulting output in Column II.
SE: Secondary electrons; BSE: Backscattered electrons;
EDS: Energy Dispersive Spectroscopy; EBSD: Electron Backscatter Diffraction
Column I
(P) SE Detector
(Q) BSE Detector
(R) EDS Detector
(S) EBSD Detector
Column II
(1) Elemental composition analysis
(2) Kikuchi lines
(3) Topographic image
(4) Compositional contrast image
Your answerChoose one option.
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2025XE-C
GATE XE 2025 · Paper 1
Engineering Sciences · Original paper archive
- Section
- Section XE-C
- Question type
- Multiple choice (MCQ)
- Marks
- 2 marks
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